Semiconductor Engineering

Using High-Quality Deterministic Patterns For In-System/In-Field Testing

Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Electronic Design

Simulation Mismatches Can Foul Up Test-Pattern Verification

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
EDN

Test solutions to confront silent data corruption in ICs

While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...
Semiconductor Engineering

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...